发明名称 Chemical mechanical polishing slurry useful for copper substrates
摘要 A chemical mechanical polishing slurry precursor composition comprising urea and at least one metal oxide abrasive. Also disclosed is a method for polishing a substrate including at least one metal layer comprising the steps of: (a) admixing such a precursor composition and deionized water to form a chemical mechanical polishing slurry precursor composition; (b) admixing the precursor composition of step (a) with hydrogen peroxide to form a chemical mechanical polishing slurry composition; (c) applying the chemical mechanical polishing slurry composition of step (b) to the substrate; and (d) removing at least a portion of the metal layer from the substrate by bringing a pad into contact with the substrate and moving the pad in relation to the substrate.
申请公布号 EP1559762(B1) 申请公布日期 2012.09.05
申请号 EP20050004891 申请日期 1997.12.05
申请人 CABOT MICROELECTRONICS CORPORATION 发明人 KAUFMAN, VLASTA BRUSIC;KISTLER, RODNEY C.;WANG, SHUMIN
分类号 C09G1/02;C09K3/14;C09K13/06;C23F3/06;H01L21/304;H01L21/306;H01L21/321 主分类号 C09G1/02
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