METHOD FOR MEASURING LAYER THICKNESS BY MEANS OF LASER TRIANGULATION, AND DEVICE,申请号KR20127009905-传众专利搜索

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发明名称	METHOD FOR MEASURING LAYER THICKNESS BY MEANS OF LASER TRIANGULATION, AND DEVICE
摘要
申请公布号	KR20120098632(A)	申请公布日期	2012.09.05
申请号	KR20127009905	申请日期	2010.06.21
申请人	SIEMENS AKTIENGESELLSCHAFT	发明人	MELZER JOKISCH TORSTEN;OPPERT ANDREAS;THOMAIDIS DIMITRIOS
分类号	G01B11/06	主分类号	G01B11/06
代理机构		代理人
主权项
地址

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