| 摘要 |
<p>An image processing device for defect inspection and others are realized as those capable of detecting various types of defects with different changes of ray paths caused thereby, at once and with sufficient accuracy. An image processing device for defect inspection (image analyzer) 6 is a device to process image data taken continually in time from a moving molded sheet with an area camera 5, which is provided with a data extraction unit 11 to extract line data at an identical position from each of different image data, for a plurality of different positions on the image data; a data storage unit 13 to arrange the plurality of line data in time series for each of the positions on the image data to generate a plurality of line-composited image data; a change amount calculation unit 15 to perform a differential operator operation on the plurality of line-composited image data to generate a plurality of emphasized image data; an identical position judgment/extraction unit 16 to extract data indicating an identical position of the molded sheet from the plurality of emphasized image data; and an integration unit 17 to accumulate, at respective pixels, brightness values of the extracted emphasized image data to generate defect inspection image data.</p> |
