发明名称 PROBE SYSTEM AND METHOD OF CLEANING DEVICE UNDER TEST
摘要 PURPOSE: A probe apparatus and a cleaning method for an inspected object are provided to accurately connect to an electrode by eliminating foreign substances in the center of the inspected object. CONSTITUTION: A main body(42) of a probe apparatus connects to electrodes by including a plurality of probes. The plurality of the probes includes a needle line which faces to a down direction. A cleaning apparatus(44) is formed a front unit under the front side of the needle line. A combination apparatus(46) relatively moves the cleaning apparatus and the probe apparatus.
申请公布号 KR20120098399(A) 申请公布日期 2012.09.05
申请号 KR20110145410 申请日期 2011.12.29
申请人 KABUSHIKI KAISHA NIHON MICRONICS 发明人 OSANAI YASUAKI;NARAOKA SHUJI
分类号 G01R31/28;G01R1/067;G01R31/26 主分类号 G01R31/28
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