发明名称 |
PROBE SYSTEM AND METHOD OF CLEANING DEVICE UNDER TEST |
摘要 |
PURPOSE: A probe apparatus and a cleaning method for an inspected object are provided to accurately connect to an electrode by eliminating foreign substances in the center of the inspected object. CONSTITUTION: A main body(42) of a probe apparatus connects to electrodes by including a plurality of probes. The plurality of the probes includes a needle line which faces to a down direction. A cleaning apparatus(44) is formed a front unit under the front side of the needle line. A combination apparatus(46) relatively moves the cleaning apparatus and the probe apparatus.
|
申请公布号 |
KR20120098399(A) |
申请公布日期 |
2012.09.05 |
申请号 |
KR20110145410 |
申请日期 |
2011.12.29 |
申请人 |
KABUSHIKI KAISHA NIHON MICRONICS |
发明人 |
OSANAI YASUAKI;NARAOKA SHUJI |
分类号 |
G01R31/28;G01R1/067;G01R31/26 |
主分类号 |
G01R31/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|