Micro-structure measurement device using diffraction of laser,申请号KR20100020225-传众专利搜索

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发明名称	Micro-structure measurement device using diffraction of laser
摘要
申请公布号	KR101180247(B1)	申请公布日期	2012.09.05
申请号	KR20100020225	申请日期	2010.03.08
申请人		发明人
分类号	G01N21/47;G01B11/00;G01N23/20	主分类号	G01N21/47
代理机构		代理人
主权项
地址

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