发明名称 Nonvolatile semiconductor storage device and method of testing the same
摘要 A nonvolatile semiconductor storage device includes a memory cell array including a plurality of memory cells arranged at intersection positions of word lines and bit lines in a matrix form, and a row decoder including a row sub-decoder to which a lower address for selecting a word line is input, wherein one unit of the row sub-decoder for selecting one word line is constituted of a first transistor of a first conduction type, and a second transistor of a second conduction type, and a gate electrode of each of the first and second transistors is arranged in a direction in which the bit lines are arranged.
申请公布号 US8259493(B2) 申请公布日期 2012.09.04
申请号 US20090433173 申请日期 2009.04.30
申请人 OHTA HITOSHI;KAWANO TOMOHITO;UMEZAWA AKIRA;KABUSHIKI KAISHA TOSHIBA 发明人 OHTA HITOSHI;KAWANO TOMOHITO;UMEZAWA AKIRA
分类号 G11C11/34;G11C16/04 主分类号 G11C11/34
代理机构 代理人
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