发明名称 Semiconductor device having tri-gate structure and manufacturing method thereof
摘要 A semiconductor device of an example of the invention comprises a memory cell and a select gate transistor provided for the memory cell. A gate electrode of the select gate transistor has a Tri-gate structure in which an upper surface of a gate insulating film formed above a channel of the select gate transistor is set higher than a portion of an upper surface of an element isolation region of the select gate transistor.
申请公布号 US8258562(B2) 申请公布日期 2012.09.04
申请号 US20090470030 申请日期 2009.05.21
申请人 IZUMIDA TAKASHI;KANEMURA TAKAHISA;AOKI NOBUTOSHI;KABUSHIKI KAISHA TOSHIBA 发明人 IZUMIDA TAKASHI;KANEMURA TAKAHISA;AOKI NOBUTOSHI
分类号 H01L29/76 主分类号 H01L29/76
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