发明名称 Semiconductor device
摘要 The present invention is directed to provide a semiconductor device having a dual-port memory circuit in which influence of placement of replica cells exerted on enlargement of chip area is reduced. A memory cell array of a dual-port memory circuit has: a first replica cell array used to respond to an instruction of reading operation from one of dual ports; and a second replica cell array used to respond to an instruction of reading operation from the other dual port. Each of the replica cell arrays has: replica bit lines obtained by mutually short-circuiting parallel lines having a length obtained by cutting, in half, an inversion bit line and a non-inversion bit line of complementary bit lines to which data input/output terminals of a memory cell are coupled; and replica cells coupled to the replica bit lines and having transistor placement equivalent to that of the memory cells.
申请公布号 US8259524(B2) 申请公布日期 2012.09.04
申请号 US20100838466 申请日期 2010.07.18
申请人 FUNANE KIYOTADA;YANAGITANI YUTA;TANAKA SHINJI;RENESAS ELECTRONICS CORPORATION 发明人 FUNANE KIYOTADA;YANAGITANI YUTA;TANAKA SHINJI
分类号 G11C7/10;G11C7/02;G11C8/00 主分类号 G11C7/10
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