发明名称 Double rie damascene process for nose length control
摘要 Methods of forming a write pole are disclosed. A first photomask having a first opening over one of a yoke region and a pole tip region of the write pole is formed over an insulation layer having an insulator material. A first etch process is performed on the insulation layer via the first opening, the first etch process removing the insulator material from a corresponding one of the yoke region and the pole tip region. A second photomask having a second opening over the other one of the yoke region and the pole tip region is formed over the insulation layer. A second etch process is performed on the insulation layer via the second opening, the second etch process removing the insulator material from a corresponding one of the yoke region and the pole tip region.
申请公布号 US8257597(B1) 申请公布日期 2012.09.04
申请号 US20100717090 申请日期 2010.03.03
申请人 GUAN LIJIE;SHI CHANGQING;JIANG MING;LI YUN-FEI;WESTERN DIGITAL (FREMONT), LLC 发明人 GUAN LIJIE;SHI CHANGQING;JIANG MING;LI YUN-FEI
分类号 B44C1/22 主分类号 B44C1/22
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