发明名称 Curing low-k dielectrics for improving mechanical strength
摘要 An integrated circuit structure including reflective metal pads is provided. The integrated circuit structure includes a semiconductor substrate; a first low-k dielectric layer overlying the semiconductor substrate, wherein the first low-k dielectric layer is a top low-k dielectric layer; a second low-k dielectric layer immediately underlying the first low-k dielectric layer; and a reflective metal pad in the second low-k dielectric layer.
申请公布号 US8258629(B2) 申请公布日期 2012.09.04
申请号 US20080060999 申请日期 2008.04.02
申请人 LIOU JOUNG-WEI;LIN KENG-CHU;JENG SHWANG-MING;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIOU JOUNG-WEI;LIN KENG-CHU;JENG SHWANG-MING
分类号 H01L23/48 主分类号 H01L23/48
代理机构 代理人
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