| 摘要 |
A system for managing the operation of a semiconductor device in accordance with varying load conditions that affect the power being dissipated by the semiconductor device, includes a sensor for measuring a temperature related to the junction temperature of an operating semiconductor device; electronic components for measuring the real-time operating load conditions of the operating semiconductor device; and a computer that is adapted by computer executable program instructions to perform the steps of: (a) determining the power being dissipated by the operating semiconductor device in accordance with the measured real-time operating load conditions of the semiconductor device; (b) determining a dynamic temperature cutback threshold for the operating semiconductor device in accordance with the determination of the power being dissipated; and (c) managing the operation of the semiconductor device in accordance with the measured temperature and the dynamic temperature cutback threshold. |
