QUANTUM BEAM AIDED ATOMIC FORCE MICROSCOPY AND QUANTUM BEAM AIDED ATOMIC FORCE MICROSCOPE

摘要

A quantum beam aided atomic force microscope and quantum beam aided atomic force microscopy that can realize simultaneously performing of atomic-level configuration observation and elemental analysis with the use of an atomic force microscope and further can effect analysis of the chemical state of sample surfaces and that as being operable in liquids, can realize the elemental analysis and chemical state analysis of biosamples with an atomic-level resolving power. Accordingly, atoms of sample surface are irradiated with quantum beams, such as charged particles, electrons and photons, having a given electron transition energy characteristic of element, and any change of interactive force between the atoms of sample surface having been irradiated with quantum beams and the distal end of the probe is detected.