发明名称 SILICON NITRIDE FILM DEPOSITION METHOD, ORGANIC ELECTRONIC DEVICE MANUFACTURING METHOD, AND SILICON NITRIDE FILM DEPOSITION DEVICE
摘要 A silicon nitride film deposition method for depositing a silicon nitride film on a substrate housed in a processing vessel, wherein a processing gas containing a silane gas, a nitrogen gas and a hydrogen gas is supplied to the processing vessel, plasma is generated by exciting the processing gas, and a silicon nitride film is deposited on the substrate by means of plasma processing with said plasma. The silicon nitride film is used as a sealing film of an organic electronic device. During the plasma processing with said plasma, the pressure inside the processing vessel is maintained between 20-60Pa.
申请公布号 WO2012114856(A1) 申请公布日期 2012.08.30
申请号 WO2012JP52608 申请日期 2012.02.06
申请人 TOKYO ELECTRON LIMITED;ISHIKAWA, HIRAKU 发明人 ISHIKAWA, HIRAKU
分类号 H01L21/318;H01L51/50;H05B33/04;H05B33/10 主分类号 H01L21/318
代理机构 代理人
主权项
地址