发明名称 |
SILICON NITRIDE FILM DEPOSITION METHOD, ORGANIC ELECTRONIC DEVICE MANUFACTURING METHOD, AND SILICON NITRIDE FILM DEPOSITION DEVICE |
摘要 |
A silicon nitride film deposition method for depositing a silicon nitride film on a substrate housed in a processing vessel, wherein a processing gas containing a silane gas, a nitrogen gas and a hydrogen gas is supplied to the processing vessel, plasma is generated by exciting the processing gas, and a silicon nitride film is deposited on the substrate by means of plasma processing with said plasma. The silicon nitride film is used as a sealing film of an organic electronic device. During the plasma processing with said plasma, the pressure inside the processing vessel is maintained between 20-60Pa.
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申请公布号 |
WO2012114856(A1) |
申请公布日期 |
2012.08.30 |
申请号 |
WO2012JP52608 |
申请日期 |
2012.02.06 |
申请人 |
TOKYO ELECTRON LIMITED;ISHIKAWA, HIRAKU |
发明人 |
ISHIKAWA, HIRAKU |
分类号 |
H01L21/318;H01L51/50;H05B33/04;H05B33/10 |
主分类号 |
H01L21/318 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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