发明名称 METHODS OF SELF-ALIGNED GROWTH OF CHALCOGENIDE MEMORY ACCESS DEVICE
摘要 <p>Self-aligning fabrication methods for forming memory access devices comprising a doped chalcogenide material. The methods may be used for forming three-dimensionally stacked cross point memory arrays. The method includes forming an insulating material over a first conductive electrode, patterning the insulating material to form vias that expose portions of the first conductive electrode, forming a memory access device within the vias of the insulating material and forming a memory element over the memory access device, wherein data stored in the memory element is accessible via the memory access device. The memory access device is formed of a doped chalcogenide material and formed using a self-aligned fabrication method.</p>
申请公布号 SG182384(A1) 申请公布日期 2012.08.30
申请号 SG20120049862 申请日期 2010.12.15
申请人 MICRON TECHNOLOGY, INC. 发明人 GREELEY, NEIL;SRINIVASAN, BHASKAR;SANDHU, GURTEJ;SMYTHE, JOHN
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