发明名称 Method of Manufacturing Semiconductor Device Having Metal Gate
摘要 The present invention provides a method of manufacturing semiconductor device having metal gate. First, a substrate is provided. A first conductive type transistor having a first sacrifice gate and a second conductive type transistor having a second sacrifice gate are disposed on the substrate. The first sacrifice gate is removed to form a first trench and then a first metal layer and a first material layer are formed in the first trench. Next, the first metal layer and the first material layer are flattened. The second sacrifice gate is removed to form a second trench and then a second metal layer and a second material layer are formed in the second trench. Lastly, the second metal layer and the second material layer are flattened.
申请公布号 US2012220113(A1) 申请公布日期 2012.08.30
申请号 US201113033616 申请日期 2011.02.24
申请人 LIAO PO-JUI;TSAI TSUNG-LUNG;LIN CHIEN-TING;HSU SHAO-HUA;LU SHUI-YEN;CHOU PEI-YU;CHEN SHIN-CHI;LIAO JIUNN-HSIUNG;TSAI SHANG-YUAN;YANG CHAN-LON;TSAI TENG-CHUN;LIN CHUN-HSIEN 发明人 LIAO PO-JUI;TSAI TSUNG-LUNG;LIN CHIEN-TING;HSU SHAO-HUA;LU SHUI-YEN;CHOU PEI-YU;CHEN SHIN-CHI;LIAO JIUNN-HSIUNG;TSAI SHANG-YUAN;YANG CHAN-LON;TSAI TENG-CHUN;LIN CHUN-HSIEN
分类号 H01L21/28 主分类号 H01L21/28
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