发明名称 LOW-TEMPERATURE SELECTIVE EPITAXIAL GROWTH OF SILICON FOR DEVICE INTEGRATION
摘要 An epitaxy method includes providing (402) an exposed crystalline region of a substrate material. Silicon is epitaxially deposited (404) on the substrate material in a low temperature process wherein a deposition temperature is less than 500 degrees Celsius. A source gas is diluted (408) with a dilution gas with a gas ratio of dilution gas to source gas of less than 1000.
申请公布号 WO2012115743(A1) 申请公布日期 2012.08.30
申请号 WO2012US22716 申请日期 2012.01.26
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;HEKMATSHOAR-TABARI, BAHMAN;KHAKIFIROOZ, ALI;REZNICEK, ALEXANDER;SADANA, DEVENDRA, K.;SHAHIDI, GHAVAM, G.;SHAHRJERDI, DAVOOD 发明人 HEKMATSHOAR-TABARI, BAHMAN;KHAKIFIROOZ, ALI;REZNICEK, ALEXANDER;SADANA, DEVENDRA, K.;SHAHIDI, GHAVAM, G.;SHAHRJERDI, DAVOOD
分类号 H01L21/00 主分类号 H01L21/00
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