| 摘要 |
There is provided a test apparatus that is capable of applying, to a device under test, a current that rises within a short period. A test apparatus for testing a device under test, includes a current source that supplies the device under test with a current, a dummy load that has an electrical characteristic corresponding to an electrical characteristic of the device under test, and a switching section that switches whether the current source is connected to the dummy load or the device under test. Here, after connecting the current source to the dummy load, the switching section disconnects the current source from the dummy load and connects the current source to the device under test when a voltage applied to the dummy load reaches a voltage within a predetermined range. |
