发明名称 |
CAPACITANCE DETECTION CIRCUIT |
摘要 |
<P>PROBLEM TO BE SOLVED: To shorten a data update rate without deteriorating precision (quantization noise) of a delta sigma AD converter in a capacitance detection circuit. <P>SOLUTION: The frequency of a sampling clock ADC_CLK of a delta sigma AD converter 16 is set to be higher than the frequency of an amplifier clock AMP_CLK of a charge amplifier 14 so as to shorten the data update rate of N-bit digital data AD_OUT output from the delta sigma AD converter 16. Further, a track holding circuit 15 is interposed between the charge amplifier 14 and delta sigma AD converter 16 so as to periodically take in and hold only an output voltage AMP_OUT in a charge transfer mode of the charge amplifier 14. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012164083(A) |
申请公布日期 |
2012.08.30 |
申请号 |
JP20110023183 |
申请日期 |
2011.02.04 |
申请人 |
SEMICONDUCTOR COMPONENTS INDUSTRIES LLC |
发明人 |
KOBAYASHI KAZUYUKI |
分类号 |
G06F3/041;G06F3/044;H03K17/955;H03K17/96;H03M3/02 |
主分类号 |
G06F3/041 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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