发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To manufacture a semiconductor device in simple processes. <P>SOLUTION: A fifth interlayer insulation film 113e is disposed on an imaging region 103 and a peripheral region 104 of a semiconductor substrate 101. An opening 116 is formed at a position overlapping with a photoelectric conversion part 105 of the fifth interlayer insulation film 113e. A first waveguide member 118 is formed on the imaging region 103 and the peripheral region 104 of the semiconductor substrate 101. A part of the first waveguide member 118, disposed on the peripheral region 104, is removed to expose the fifth interlayer insulation film 113e. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012164945(A) 申请公布日期 2012.08.30
申请号 JP20110026355 申请日期 2011.02.09
申请人 CANON INC 发明人 SUZUKI KENTARO;OKABE TAKESHI;SANO HIROAKI;IWATA JUNJI
分类号 H01L27/14;H01L21/768;H01L27/146;H01L31/10;H04N5/369 主分类号 H01L27/14
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