发明名称 APPARATUS AND METHOD FOR MONITORING QUALITY OF CHIP MOUNTER PROCESSING
摘要 PURPOSE: A quality monitoring apparatus and method of a chip mounting process are provided to inspect mounting quality of a chip in real time by adding an electric signal when the chip is mounted. CONSTITUTION: A quality monitoring apparatus of a chip mounting process comprises a pick-up part(10), a detecting part(40), and a determining part(50). The pick-up part picks up a chip and mounts the chip on a substrate. The chip comprises a plurality of chip bumps. The detecting part detects conducting level of the chip and the substrate by supplying electricity through the pick-up part. The determining part determines the quality of the mounting of the chip based on the conducting level detected by the detecting part.
申请公布号 KR20120096279(A) 申请公布日期 2012.08.30
申请号 KR20110015592 申请日期 2011.02.22
申请人 SAMSUNG TECHWIN CO., LTD. 发明人 KOOK, SUNG JUNE
分类号 G01R31/02;H05K13/08 主分类号 G01R31/02
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