发明名称 SEMICONDUCTOR CIRCUIT DESIGN SUPPORT PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To enable collection of observation data at multiple observation points in an observation target circuit from a simulation accelerator in a realistic period. <P>SOLUTION: Upon receiving designation of observation points in an observation target circuit whose operation is to be observed in a simulation, circuit data of an observing circuit is added to circuit data of the observation target circuit stored in an observation target circuit data storage unit, so that the observing circuit is connected to the observation target circuit in accordance with data relating to the designation of the observation points. At that time, the observation circuit has a double buffer configuration and alternately outputs and stores, into a RAM, an occurrence frequency of a specific state at a specific observation point in a first period and an occurrence frequency of the specific state at the specific observation point in a second period. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012164363(A) 申请公布日期 2012.08.30
申请号 JP20120119636 申请日期 2012.05.25
申请人 FUJITSU LTD 发明人 YOSHIKAWA TAKAHIDE
分类号 G06F17/50 主分类号 G06F17/50
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