发明名称 TEMPERATURE INFORMATION MEASUREMENT METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a temperature information measurement method capable of easily and speedily measuring temperature information on an analyte by appropriately processing an output value from detection means. <P>SOLUTION: The present invention obtains temperature information on an analyte using the following processes: a wavelength selection process to select two wavelengths &lambda;1 and &lambda;2 which have identical emissivity or known ratio therebetween and have identical permeability from the analyte to an inside of an optical path leading to detection means inside an imaging device or the known ratio therebetween; an input/output characteristic detection process to obtain an input/output characteristic value from a radiant quantity to be input to the detection means as well as an output value from the detection means; a calculation process to calculate offset values Qc&lambda;1 and Qc&lambda;2 respectively for the wavelength &lambda;1 and &lambda;2 from a linear function between the radiant quantity incident on the detection means and the output value when the radiant quantity is zero; a measurement process to obtain the radiant quantities R&lambda;1 and R&lambda;2 using the offset values Qc&lambda;1 and Qc&lambda;2 and the linear function; and a temperature information measurement process to obtain temperature information on the analyte using the ratio between the radiant quantities R&lambda;1 and R&lambda;2. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012163522(A) 申请公布日期 2012.08.30
申请号 JP20110025914 申请日期 2011.02.09
申请人 MITSUI OPTRONICS:KK 发明人 MITSUI KENJI
分类号 G01J5/60;G01J5/48 主分类号 G01J5/60
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