发明名称 POWER SUPPLY APPARATUS FOR TEST APPARATUS
摘要 A first A/D converter converts an analog observed value, which corresponds to a power supply signal supplied to a power supply terminal of a DUT, into a digital observed value. By means of digital calculation processing, a digital signal processing circuit generates a control value that is adjusted such that the digital observed value matches a predetermined reference value. A first D/A converter supplies, via a power supply line to the power supply terminal of the DUT, an analog power supply signal obtained by performing digital/analog conversion of the control value. A load estimating unit applies a test signal containing a predetermined frequency component via the power supply line to a node via which the power supply terminal is to be connected, and generates a control parameter for the digital signal processing circuit according to the test signal and the observed signal.
申请公布号 US2012218004(A1) 申请公布日期 2012.08.30
申请号 US201213402502 申请日期 2012.02.22
申请人 SHIMIZU TAKAHIKO;DEGAWA KATSUHIKO;ADVANTEST CORPORATION 发明人 SHIMIZU TAKAHIKO;DEGAWA KATSUHIKO
分类号 H03K5/153;H03M1/00 主分类号 H03K5/153
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