发明名称 SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF
摘要 A semiconductor device includes a semiconductor substrate having an active layer in which an element region and a contact region are formed, a support substrate supporting the active layer, and a buried insulation layer interposed between the active layer and the support substrate. A transistor clement is formed in the clement region, the transistor clement having a transistor buried impurity layer formed within the active layer. The semiconductor device further includes a substrate contact having a contact buried impurity layer formed within the contact region and a through contact extending from the surface of the active layer to the support substrate through the contact buried impurity and the buried insulation layer, the contact buried impurity layer being in the same layer as the transistor buried impurity layer.
申请公布号 US2012217574(A1) 申请公布日期 2012.08.30
申请号 US201213403313 申请日期 2012.02.23
申请人 KUMANO HIROSHI;ROHM CO., LTD. 发明人 KUMANO HIROSHI
分类号 H01L27/088;H01L21/336 主分类号 H01L27/088
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