发明名称 SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a silicon carbide semiconductor device including a drift layer that has a desired impurity concentration and high crystallinity. <P>SOLUTION: A buffer layer 31 is provided on a substrate 30, is made from silicon carbide containing an impurity, and has a thickness ranging from 1 &mu;m to 7 &mu;m. A drift layer 32 is provided on the buffer layer 31 and is made from silicon carbide having a smaller impurity concentration than the silicon carbide constituting the buffer layer 31. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012164790(A) 申请公布日期 2012.08.30
申请号 JP20110023677 申请日期 2011.02.07
申请人 SUMITOMO ELECTRIC IND LTD 发明人 ITO SATOMI;HARADA MAKOTO;GENBAN JUN;FUJIKAWA KAZUHIRO
分类号 H01L29/808;H01L21/205;H01L21/336;H01L21/337;H01L27/098;H01L29/12;H01L29/739;H01L29/78 主分类号 H01L29/808
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