发明名称 |
SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a silicon carbide semiconductor device including a drift layer that has a desired impurity concentration and high crystallinity. <P>SOLUTION: A buffer layer 31 is provided on a substrate 30, is made from silicon carbide containing an impurity, and has a thickness ranging from 1 μm to 7 μm. A drift layer 32 is provided on the buffer layer 31 and is made from silicon carbide having a smaller impurity concentration than the silicon carbide constituting the buffer layer 31. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012164790(A) |
申请公布日期 |
2012.08.30 |
申请号 |
JP20110023677 |
申请日期 |
2011.02.07 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
ITO SATOMI;HARADA MAKOTO;GENBAN JUN;FUJIKAWA KAZUHIRO |
分类号 |
H01L29/808;H01L21/205;H01L21/336;H01L21/337;H01L27/098;H01L29/12;H01L29/739;H01L29/78 |
主分类号 |
H01L29/808 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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