发明名称 COMPOSITIONS AND METHODS FOR CHEMICAL-MECHANICAL POLISHING OF PHASE CHANGE MATERIALS
摘要 <p>The present invention provides a chemical-mechanical polishing (CMP) composition suitable for polishing a substrate comprising a phase change material (PCM), such as a germanium-antimony-tellurium (GST) alloy. The composition comprises a particulate abrasive material in combination with lysine, an optional oxidizing agent, and an aqueous carrier therefor. CMP methods for polishing a phase change material-containing substrate utilizing the composition are also disclosed.Figure 1</p>
申请公布号 SG183081(A1) 申请公布日期 2012.08.30
申请号 SG20120055414 申请日期 2008.07.24
申请人 CABOT MICROELECTRONICS CORPORATION 发明人 CHEN, ZHAN;LUO, KAI;VACASSY, ROBERT
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