发明名称 METHOD OF FORMING TITANIUM NITRIDE FILM, APPARATUS FOR FORMING TITANIUM NITRIDE FILM, AND PROGRAM
摘要 According to the method of forming a titanium nitride film, first, an inside of a reaction pipe accommodating a semiconductor wafer is heated up to 200° C. to 350° C. by using a temperature increasing heater. Then, the titanium nitride film is formed on the semiconductor wafer by supplying a film forming gas including a titanium raw material into the reaction pipe. Methylcyclopentadienyl tris(dimethylamino)titanium that does not include a chlorine atom and includes titanium is used as the titanium raw material.
申请公布号 US2012219710(A1) 申请公布日期 2012.08.30
申请号 US201213404547 申请日期 2012.02.24
申请人 MOROZUMI YUICHIRO;HISHIYA SHINGO;HARADA KATSUSHIGE;TOKYO ELECTRON LIMITED 发明人 MOROZUMI YUICHIRO;HISHIYA SHINGO;HARADA KATSUSHIGE
分类号 C23C16/34;C23C16/52 主分类号 C23C16/34
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