发明名称 |
MICROCONTROLLER FOR LOGIC BUILT-IN SELF TEST (LBIST) |
摘要 |
Built-in self-test (BIST) microcontroller integrated circuit adapted for logic verification. Microcontroller includes a plurality of hardware description language files representing a hierarchical description of the microcontroller, the plurality of hardware description language files including a library of circuit design elements, a plurality of library design circuit elements adapted to store a uniquely defined set of input and output signals to enable a logic BIST, and a plurality of latches adapted to store a plurality of values corresponding to a behavioral profile of a test clock. |
申请公布号 |
US2012221910(A1) |
申请公布日期 |
2012.08.30 |
申请号 |
US201213469604 |
申请日期 |
2012.05.11 |
申请人 |
GRISE GARY D.;LACKEY DAVID E.;OAKLAND STEVEN F.;WHEATER DONALD L.;INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
GRISE GARY D.;LACKEY DAVID E.;OAKLAND STEVEN F.;WHEATER DONALD L. |
分类号 |
G01R31/3177;G06F11/25 |
主分类号 |
G01R31/3177 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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