发明名称 |
METHOD FOR FORMING SEMICONDUCTOR SUBSTRATE ISOLATIONS |
摘要 |
A method for forming semiconductor substrate isolations is provided. The method comprises the following steps: providing a semiconductor substrate, forming a first oxide layer and a nitride layer on the substrate in turn, exposing parts of the substrate by forming openings in the first oxide layer and the nitride layer, implanting oxygen ions into the substrate through the openings, forming a second oxide layer at least on the surface of the parts of the semiconductor substrate by performing annealing operation, and removing the first oxide layer and the nitride layer.
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申请公布号 |
WO2012113115(A1) |
申请公布日期 |
2012.08.30 |
申请号 |
WO2011CN00613 |
申请日期 |
2011.04.08 |
申请人 |
INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;YIN, HAIZHOU;LUO, ZHIJIONG;ZHU, HUILONG |
发明人 |
YIN, HAIZHOU;LUO, ZHIJIONG;ZHU, HUILONG |
分类号 |
H01L21/762 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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