发明名称 METHOD FOR FORMING SEMICONDUCTOR SUBSTRATE ISOLATIONS
摘要 A method for forming semiconductor substrate isolations is provided. The method comprises the following steps: providing a semiconductor substrate, forming a first oxide layer and a nitride layer on the substrate in turn, exposing parts of the substrate by forming openings in the first oxide layer and the nitride layer, implanting oxygen ions into the substrate through the openings, forming a second oxide layer at least on the surface of the parts of the semiconductor substrate by performing annealing operation, and removing the first oxide layer and the nitride layer.
申请公布号 WO2012113115(A1) 申请公布日期 2012.08.30
申请号 WO2011CN00613 申请日期 2011.04.08
申请人 INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;YIN, HAIZHOU;LUO, ZHIJIONG;ZHU, HUILONG 发明人 YIN, HAIZHOU;LUO, ZHIJIONG;ZHU, HUILONG
分类号 H01L21/762 主分类号 H01L21/762
代理机构 代理人
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