发明名称 APPARATUS OF DETERMINING NORMAL/DEFECTIVE CONDITION OF ELECTRODE CHIP
摘要 PURPOSE: A quality judging apparatus for electrode chips is provided to remove a maintenance work for a light transmitting unit and a light receiving unit of an optical sensor because dust or water drops attached on a front section of an upper electrode chip are not attached to the light transmitting unit and the light receiving unit of upper and lower optical sensors. CONSTITUTION: A quality judging apparatus for electrode chips(M) irradiates the light, emitted from light transmitting units(26,36) of optical sensors(23,33), on a front section(11b). The apparatus judges the quality of the front section of upper and lower electrode chips(11U,11B) with the strength of reflected light receiving from light receiving units(27,37) of the optical sensors. An inspection unit(S) is installed around the upper and lower electrode chips and comprises the light transmitting units and the light receiving units of the optical sensors and a holder(40) for fixing the light transmitting units and the light receiving units of the optical sensors.
申请公布号 KR20120096391(A) 申请公布日期 2012.08.30
申请号 KR20110067733 申请日期 2011.07.08
申请人 KYOKUTOH CO., LTD. 发明人 NAKAJIMA KOTARO
分类号 B23K11/30;G01N21/88 主分类号 B23K11/30
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