| 摘要 |
<P>PROBLEM TO BE SOLVED: To enhance ESD immunity in a semiconductor integrated circuit device by preventing transmission of a wrong signal caused by power supply noise surely, while minimizing increase in the occupied area for the circuit. <P>SOLUTION: A power supply noise detection circuit (200) is provided in a power supply cell (502). A noise canceller (300) is provided in an I/O cell 506. A power supply noise detection circuit 200 detects either of positive polarity/negative polarity power supply noises, superimposed on a power supply voltage (HVDD) on the high level side and a positive polarity power supply noise, superimposed on a power supply voltage (VSS1) on the low level side, and operates the noise canceller 300. Consequently, transmission of a wrong signal caused by power supply noise is blocked, and serious malfunction of electrical apparatus is prevented. <P>COPYRIGHT: (C)2008,JPO&INPIT |
