发明名称 SYSTEM AND METHOD FOR THE DEFECT ANALYSIS OF WORKPIECES
摘要 An apparatus (100, 700) for analyzing an object (201), the analysis apparatus (700) comprising a thermal analysis device (104) adapted for analyzing a thermal distribution of the object in response to a thermal activation of the object, a geometrical measurement device (106) adapted for analyzing the geometry of the object, and an evaluation unit (101) adapted for performing a combined evaluation of information obtained from the thermal analysis device (104) and from the geometrical measurement device (106).
申请公布号 EP2102639(B1) 申请公布日期 2012.08.29
申请号 EP20060829531 申请日期 2006.12.12
申请人 MONTANUNIVERSITAET LEOBEN 发明人 O'LEARY, PAUL;OSWALD-TRANTA, BEATE;WALLY, GERNOT
分类号 G01N25/72;G01B11/04;G01B11/24 主分类号 G01N25/72
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