发明名称 |
SYSTEM AND METHOD FOR THE DEFECT ANALYSIS OF WORKPIECES |
摘要 |
An apparatus (100, 700) for analyzing an object (201), the analysis apparatus (700) comprising a thermal analysis device (104) adapted for analyzing a thermal distribution of the object in response to a thermal activation of the object, a geometrical measurement device (106) adapted for analyzing the geometry of the object, and an evaluation unit (101) adapted for performing a combined evaluation of information obtained from the thermal analysis device (104) and from the geometrical measurement device (106). |
申请公布号 |
EP2102639(B1) |
申请公布日期 |
2012.08.29 |
申请号 |
EP20060829531 |
申请日期 |
2006.12.12 |
申请人 |
MONTANUNIVERSITAET LEOBEN |
发明人 |
O'LEARY, PAUL;OSWALD-TRANTA, BEATE;WALLY, GERNOT |
分类号 |
G01N25/72;G01B11/04;G01B11/24 |
主分类号 |
G01N25/72 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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