发明名称 Techniques to improve characteristics of processed semiconductor substrates
摘要 Techniques to improve characteristics of processed semiconductor substrates are described, including cleaning a substrate using a preclean process, the substrate comprising a dielectric region and a conductive region, introducing a hydroquinone to the substrate after cleaning the substrate using the preclean operation, and forming a capping layer over the conductive region of the substrate after introducing the hydroquinone.
申请公布号 US8252685(B2) 申请公布日期 2012.08.28
申请号 US201113289279 申请日期 2011.11.04
申请人 DUONG ANH NGOC;LANG CHI-I;INTERMOLECULAR, INC. 发明人 DUONG ANH NGOC;LANG CHI-I
分类号 H01L21/44 主分类号 H01L21/44
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