发明名称 Double-side grinding apparatus for wafer and double-side grinding method
摘要 A double-side grinding apparatus is designed to be capable of minimizing thermal expansion of hydrostatic pad members and reducing nanotopography in performing wafer grinding. The double-side grinding apparatus is a double-side grinding apparatus for wafers that can simultaneously grind either surface of a wafer to be ground by pressing a grindstone against either surface of the wafer to be ground while hydrostatically supporting either surface of the wafer to be ground in a noncontact manner. Each hydrostatic supporting unit is formed with a hydrostatic pad member facing the wafer to be ground, and a base member placed on the back surface of the hydrostatic pad member. The hydrostatic pad member is made of a ceramic member, and the base member is made of a metal member.
申请公布号 US8251778(B2) 申请公布日期 2012.08.28
申请号 US20090607265 申请日期 2009.10.28
申请人 FUTAMURA HIROYASU;SUMCO TECHXIV CORPORATION 发明人 FUTAMURA HIROYASU
分类号 B24B7/16;B24B7/17;B24B41/06 主分类号 B24B7/16
代理机构 代理人
主权项
地址