发明名称 Sub-micron decal transfer lithography
摘要 The present invention provides a method of sub-micron decal transfer lithography. The method includes forming a first pattern in a surface of a first silicon-containing elastomer, bonding at least a portion of the first pattern to a substrate, and etching a portion of at least one of the first silicon-containing elastomer and the substrate.
申请公布号 US8252191(B2) 申请公布日期 2012.08.28
申请号 US20060911787 申请日期 2006.05.05
申请人 HEEJOON AHN;NUZZO RALPH;SHIM ANNE;DOW CORNING CORPORATION 发明人 HEEJOON AHN;NUZZO RALPH;SHIM ANNE
分类号 B44C1/22 主分类号 B44C1/22
代理机构 代理人
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