发明名称 TIMING ANALYSIS SYSTEM OF SEMICONDUCTOR CHIP AND METHOD THEREOF
摘要 PURPOSE: A timing analysis system of a semiconductor chip and method thereof are provided to accurately predict a timing yield by accurately reflecting a phenomenon generated in silicon. CONSTITUTION: A net-list definition block(110) defines a net-list. A time delay definition block(160) defines the time delay of devices defined by the net-list. A time determination block(150) determines the time delay of a semiconductor chip by determining a p-value by executing a normalization test using the time delays. When the p-value is bigger than a predetermined value, the timing determination block determines the time delay of the semiconductor chip based on regular normalization.
申请公布号 KR20120095210(A) 申请公布日期 2012.08.28
申请号 KR20110014738 申请日期 2011.02.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, BYUNG SU;CHOI, HUNG BOK;LEE, BONG HYUN
分类号 G06F19/00;G06F17/50 主分类号 G06F19/00
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