发明名称 Immersion lithography system using a sealed wafer bath
摘要 Immersion lithography system and method using a sealed wafer bottom are described. One embodiment is an immersion lithography apparatus comprising a lens assembly comprising an imaging lens and a wafer stage for retaining a wafer beneath the lens assembly, the wafer stage comprising a seal ring disposed on a seal ring frame along a top edge of the wafer retained on the wafer stage, the seal ring for sealing a gap between an edge of the wafer and the wafer stage. The embodiment further includes a fluid tank for retaining immersion fluid, the fluid tank situated with respect to the wafer stage for enabling full immersion of the wafer retained on the wafer stage in the immersion fluid and a cover disposed over at least a portion of the fluid tank for providing a temperature-controlled, fluid-rich environment within the fluid tank.
申请公布号 US8253922(B2) 申请公布日期 2012.08.28
申请号 US20070671046 申请日期 2007.02.05
申请人 LIN BUM-JENG;CHANG CHING-YU;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIN BUM-JENG;CHANG CHING-YU
分类号 G03B27/52 主分类号 G03B27/52
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