发明名称 Metal gate transistor and resistor and method for fabricating the same
摘要 A method for fabricating metal gate transistor and resistor is disclosed. The method includes the steps of: providing a substrate having a transistor region and a resistor region; forming a shallow trench isolation in the substrate of the resistor region; forming a tank in the shallow trench isolation of the resistor region; forming at least one gate in the transistor region and a resistor in the tank of the resistor region; and transforming the gate into a metal gate transistor.
申请公布号 US8252657(B2) 申请公布日期 2012.08.28
申请号 US201113072766 申请日期 2011.03.27
申请人 TSENG CHIH-YU;LIN CHIEN-TING;TSENG KUN-SZU;FAN CHENG-WEN;LIANG VICTOR-CHIANG;UNITED MICROELECTRONICS CORP. 发明人 TSENG CHIH-YU;LIN CHIEN-TING;TSENG KUN-SZU;FAN CHENG-WEN;LIANG VICTOR-CHIANG
分类号 H01L21/20;H01L21/8222;H01L21/8234;H01L21/8238;H01L21/8244 主分类号 H01L21/20
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