ELECTRON MICROSCOPE AND METHOD OF ESTIMATING DEFOCUS THEREFOR.,申请号NL20112006300-传众专利搜索

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发明名称	ELECTRON MICROSCOPE AND METHOD OF ESTIMATING DEFOCUS THEREFOR.
摘要
申请公布号	NL2006300(C)	申请公布日期	2012.08.28
申请号	NL20112006300	申请日期	2011.02.25
申请人	TECHNISCHE UNIVERSITEIT DELFT, NULL	发明人	TEJADA RUIZ, ARTURO;DEKKER, ARNOLD JAN
分类号	H01J37/26;H01J37/28	主分类号	H01J37/26
代理机构		代理人
主权项
地址

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