发明名称 SEMICONDUCTOR STRUCTURE INCLUDING FINS AND METHOD OF FORMING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of forming fins capable of improving the fin height. <P>SOLUTION: In a method of forming fins, first, a multilayer structure is formed on a semiconductor substrate. The semiconductor structure includes a first layer on the semiconductor substrate, a second layer on the first layer, and a third layer on the second layer. Next, in order to form a plurality of fins composed of a plurality of portions of the semiconductor substrate and the semiconductor structure, a plurality of upper portions of the semiconductor substrate and a plurality of portions of the semiconductor structure are removed. Subsequently, the first layer is selectively oxidized while the oxidation speed of the second layer and the third layer is smaller than that of the first layer. Subsequently, gaps between the plurality of fins are filled with an insulating material after the selective oxidation. Then, at least a portion of the insulating material is recessed so that the fins are exposed to make at least one side surface or the top surface of the fins become a channel region. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012160730(A) 申请公布日期 2012.08.23
申请号 JP20120014172 申请日期 2012.01.26
申请人 TOSHIBA CORP;GLOBALFOUNDRIES INC;INTERNATL BUSINESS MACH CORP <IBM> 发明人 KAWASAKI HIROHISA;BASKER VEERARAGHAVAN;HEMANT ADHIKARI;WITOLD MASZARA
分类号 H01L29/78;H01L21/336;H01L29/786 主分类号 H01L29/78
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