发明名称 III-V SEMICONDUCTOR STRUCTURES WITH DIMINISHED PIT DEFECTS AND METHODS FOR FORMING THE SAME
摘要 Embodiments relate to semiconductor structures and methods of forming them. In some embodiments, the methods may be used to fabricate semiconductor structures of III-V materials, such as InGaN. An In-III-V semiconductor layer is grown with an Indium concentration above a saturation regime by adjusting growth conditions such as a temperature of a growth surface to create a super-saturation regime wherein the In-III-V semiconductor layer will grow with a diminished density of V-pits relative to the saturation regime.
申请公布号 US2012211870(A1) 申请公布日期 2012.08.23
申请号 US201113029213 申请日期 2011.02.17
申请人 FIGUET CHRISTOPHE;LINDOW ED;TOMASINI PIERRE;S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES 发明人 FIGUET CHRISTOPHE;LINDOW ED;TOMASINI PIERRE
分类号 H01L29/20;H01L21/20;H01L21/66 主分类号 H01L29/20
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