发明名称 SYSTEM FOR TESTING INTELLIGENT ELECTRONIC DEVICES
摘要 In one embodiment, a system is provided including: a first intelligent electronic device (IED); and a second IED in communication with the first IED, wherein each IED comprises: a transmitter for transmitting a Generic Object Oriented Substation Event (GOOSE) message to another IED at a first timestamp; a receiver for receiving the GOOSE message from the another IED at a second timestamp; a calculator for calculating a roundtrip time based on the first timestamp and the second timestamp; and a determinator for determining if the roundtrip time is within a specified roundtrip time.
申请公布号 US2012215479(A1) 申请公布日期 2012.08.23
申请号 US201113031386 申请日期 2011.02.21
申请人 PAMULAPARTHY BALAKRISHNA;LAMARRE GREGORY JAMES;KOVVALI GAYATRI PRASAD;GENERAL ELECTRIC COMPANY 发明人 PAMULAPARTHY BALAKRISHNA;LAMARRE GREGORY JAMES;KOVVALI GAYATRI PRASAD
分类号 G06F19/00 主分类号 G06F19/00
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