发明名称 Microlithography projection system with an accessible diaphragm or aperture stop
摘要 <p>The invention relates to a Microlithography projection system for imaging an object field in an object plane (100) onto an image field in an image plane (102) with a wavelength », wherein the microlithography projection system is a catoptric projection system comprising at least one intermediate image (Z1) of the object and an aperture stop (B) in the optical path of a beam of light from the object plane (100) to the image plane (102), wherein the aperture stop (B) in the optical path is arranged downstream the at least one intermediate image (Z1).</p>
申请公布号 KR101176686(B1) 申请公布日期 2012.08.23
申请号 KR20077020465 申请日期 2006.03.04
申请人 发明人
分类号 H01L21/027 主分类号 H01L21/027
代理机构 代理人
主权项
地址