发明名称 SPECTRAL CHARACTERISTIC MEASURING DEVICE, METHOD FOR CORRECTING SPECTRAL CHARACTERISTIC MEASURING DEVICE, AND PROGRAM
摘要 <p>The purpose is to enable a spectral characteristic measuring device to be rapidly and readily corrected irrespective of changes in the spectral distribution of monochromatic light for correction. To achieve this purpose, this spectral characteristic measuring device is provided with a spectroscope and a controller. In the spectroscope, light passed through an aperture of a light shield is diffracted by an optical system and irradiated onto a photoreceptor in which a plurality of light-receiving elements is arranged, and a dispersion image is formed. In the controller, wavelength information indicating a relationship between the light-receiving elements and wavelengths of light is stored, and when monochromatic light passes through the aperture to form first and second dispersion images pertaining to first- and second-order diffracted light on the photoreceptor, first and second intensity distributions of the light pertaining to the first and second dispersion images are obtained on the basis of signals outputted from the light-receiving elements; and an estimated intensity distribution of light pertaining to the second dispersion image is computed from the first intensity distribution in accordance with a predetermined relational expression. In the controller, an amount of variation pertaining to the wavelength information is also computed on the basis of the estimated intensity distribution and the second intensity distribution, and the wavelength information is corrected according to the amount of variation.</p>
申请公布号 WO2012111455(A1) 申请公布日期 2012.08.23
申请号 WO2012JP52496 申请日期 2012.02.03
申请人 KONICA MINOLTA SENSING, INC.;IMURA KENJI 发明人 IMURA KENJI
分类号 G01J3/18;G01J3/36 主分类号 G01J3/18
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