发明名称 CONNECTOR, PROBE, AND METHOD OF MANUFACTURING PROBE
摘要 <P>PROBLEM TO BE SOLVED: To provide a connector having a spring function, which can be manufactured at a low cost. <P>SOLUTION: In the connector having a plurality of probes which are used for electric measurement in contact with electrode terminals of an electric circuit or an electronic component. Each probe is formed by bending one metal plate and includes a front end part, a spring part formed meanderingly, an enclosure part formed by bending so as to surround the spring part, and a bend part formed by bending a portion between the spring part and the enclosure part. The connector has a first insulator part and a second insular part which cover the plurality of probes and are so installed that the front end parts of the probes are partially or entirely exposed to the outside through openings provided in the first insulator part and the bend parts of the probes are partially or entirely exposed to the outside through openings provided in the second insulator part. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012159390(A) 申请公布日期 2012.08.23
申请号 JP20110019165 申请日期 2011.01.31
申请人 FUJITSU COMPONENT LTD 发明人 TAKAHASHI YUKINORI;SATO KIMINORI;KOBAYASHI MITSURU
分类号 G01R1/067;H01L21/66 主分类号 G01R1/067
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