发明名称 |
APPARATUS AND METHOD FOR CENTERING WAFER |
摘要 |
PURPOSE: A wafer centering apparatus and a wafer centering method are provided to accurately center a wafer by controlling pressure of sprayed air. CONSTITUTION: A pad(100) is arranged in the center of a wafer. An outer spray unit(200) sprays compressed air to an edge portion of the wafer. The outer spray unit comprises a plurality of spray holes(210). The plurality of spray holes is separated at regular intervals. A central spray unit(300) sprays the compressed air toward the bottom of the wafer. The air spray pressure of the outer spray unit is stronger than the air spray pressure of the central spray unit. The air spray pressure of the outer spray unit is 20kPa to 30kPa. The air spray pressure of the central spray unit is 5kPA to 10kPa.
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申请公布号 |
KR20120093525(A) |
申请公布日期 |
2012.08.23 |
申请号 |
KR20110013139 |
申请日期 |
2011.02.15 |
申请人 |
LG SILTRON INCORPORATED |
发明人 |
JIN, YOUNG IL;CHO, HEE DON;JI, DONG OUK |
分类号 |
H01L21/68;H01L21/683 |
主分类号 |
H01L21/68 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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