发明名称 APPARATUS AND METHOD FOR CENTERING WAFER
摘要 PURPOSE: A wafer centering apparatus and a wafer centering method are provided to accurately center a wafer by controlling pressure of sprayed air. CONSTITUTION: A pad(100) is arranged in the center of a wafer. An outer spray unit(200) sprays compressed air to an edge portion of the wafer. The outer spray unit comprises a plurality of spray holes(210). The plurality of spray holes is separated at regular intervals. A central spray unit(300) sprays the compressed air toward the bottom of the wafer. The air spray pressure of the outer spray unit is stronger than the air spray pressure of the central spray unit. The air spray pressure of the outer spray unit is 20kPa to 30kPa. The air spray pressure of the central spray unit is 5kPA to 10kPa.
申请公布号 KR20120093525(A) 申请公布日期 2012.08.23
申请号 KR20110013139 申请日期 2011.02.15
申请人 LG SILTRON INCORPORATED 发明人 JIN, YOUNG IL;CHO, HEE DON;JI, DONG OUK
分类号 H01L21/68;H01L21/683 主分类号 H01L21/68
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