发明名称 BOND PAD STRUCTURE
摘要 A bonding pad structure is provided that includes two conductive layers and a connective layer interposing the two conductive layers. The connective layer includes a contiguous, conductive structure. In an embodiment, the contiguous conductive structure is a solid layer of conductive material. In other embodiments, the contiguous conductive structure is a conductive network including, for example, a matrix configuration or a plurality of conductive stripes. At least one dielectric spacer may interpose the conductive network. Conductive plugs may interconnect a bond pad and one of the conductive layers.
申请公布号 US2012211902(A1) 申请公布日期 2012.08.23
申请号 US201213463433 申请日期 2012.05.03
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.,("TSMC") 发明人 JENG SHIN-PUU;LIU YU-WEN;TSAI HAO-YI;CHEN HSIEN-WEI
分类号 H01L23/485;H01L23/49 主分类号 H01L23/485
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