发明名称 TUNABLE INTERFERENCE FILTER, OPTICAL MODULE, AND PHOTOMETRIC ANALYZER
摘要 An etalon as a tunable interference filter includes a first substrate, a second substrate, a fixed mirror, a movable mirror, and an electrostatic actuator. The respective mirrors are formed by stacking one layer of a TiO2 film and one layer of an alloy film. A film thickness dimension of the TiO2 film and a film thickness dimension of the Ag alloy film are set to film thicknesses such that reflectance of a reference wavelength may be target reflectance and reflectance of a set wavelength may be lower than that of the case where the reflection film is formed only by the metal film.
申请公布号 US2012212823(A1) 申请公布日期 2012.08.23
申请号 US201213398066 申请日期 2012.02.16
申请人 FUNAMOTO TATSUAKI;URUSHIDANI TATSUO;SEIKO EPSON CORPORATION 发明人 FUNAMOTO TATSUAKI;URUSHIDANI TATSUO
分类号 G02B5/28 主分类号 G02B5/28
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