发明名称 Filter for filtering undesired light portions in projection exposure system for microlithography, has lattice arrangement formed on glass plate that is transparent to light having particular wavelength or wavelength range
摘要 <p>The filter (4) has multiple fields (7) arranged next to each other, where each field is assigned with a light beam of particular wavelength so as to be transmissive or impermeable based on the wavelength range of the light beam. A lattice arrangement (10) encloses and defines the fields, where the lattice arrangement is formed on a glass plate (9) that is transparent to light having the particular wavelength or wavelength range. The lattice arrangement is formed such that a metal opaque stopper (13) is releasably inserted into the fields. An independent claim is also included for a projection exposure system for microlithography.</p>
申请公布号 DE102011004494(A1) 申请公布日期 2012.08.23
申请号 DE20111004494 申请日期 2011.02.22
申请人 CARL ZEISS SMT GMBH 发明人 MEIER, MARTIN, DR.
分类号 G02B26/02;G03F7/20 主分类号 G02B26/02
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