发明名称 MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a transistor including an oxide semiconductor film with extremely low off current, and provide a semiconductor device with extremely low power consumption by the use of the transistor. <P>SOLUTION: A base insulation film that releases oxygen is formed by heat treatment on a substrate, a first oxide semiconductor film is formed on the base insulation film, and the substrate is heat-treated. Next, a conductive film is formed on the first oxide semiconductor film, and the conductive film is processed into a source electrode and a drain electrode. Then, the first oxide semiconductor film is processed into a second oxide semiconductor film and just after that, a gate insulation film covering the source electrode, the drain electrode, and the second oxide semiconductor film is formed and a gate electrode is formed on the gate insulation film. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012160715(A) 申请公布日期 2012.08.23
申请号 JP20120001727 申请日期 2012.01.09
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI
分类号 H01L29/786;G02F1/1368;G09F9/00;G09F9/30;H01L21/20;H01L21/336;H01L21/8242;H01L21/8244;H01L21/8247;H01L27/10;H01L27/108;H01L27/11;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L29/786
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